Confidence Intervals for the Capability Indices C_pm and C_pmk in Stationary Gaussian Processes

Rubén Darío Guevara & José Alberto Vargas                        

 

 

Abstract

Process capability indices provide a measure of how a process meets preset specification limits. Procedures to construct confidence intervals for C_pm and C_pmk for stationary gaussian processes show low coverage probabilities. This paper presents a new methodology for constructing confidence intervals for the indices C_pm and C_pmk for stationary gaussian processes and by simulation study the coverage percentage for AR(1) processes is calculated.

 

Key words: Autocorrelation, Process capability analysis, Process capability indices, Estimation.                 

 

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