Electron. J. Math. Phys. Sci., 2002, 1,1, 114-119

 

 

STRUCTURAL AND TEM ANALYSIS OF Zn_1-XMn_XTe CRYSTALS

 

K.Veera Brahmam

Department of Physics, Lenora College of Engineering, Rampachodavaram – 533 288, INDIA, E-mail Address: kveerabrahmam@rediffmail.com

 

Received: 22 June 2002/ Accepted: 12 August 2002/ Published: 22 August 20002

Abstract: Single crystals of Zn_1-xMn_xTe have been grown using vertical Bridgman growth technique. XRD analysis supports the zincblende structure of Zn_1-xMn_xTe.  As the concentration of Mn increases (x > 2.5), the single crystalline nature deteriorates (i.e grain size decreases) and polycrystalline nature with zincblende and hexagonal phases have been observed from x-ray diffractograms.  This is supported by Transmission Electron Microscopic study of the samples.  Surface morphology is studied from optical microscopic studies. 

 

Keywords: Zn_1-xMn_xTe (ZMT)Crystals, Transmission electron microscopy (TEM), Bridgman growth technique, Optical microscopy.

PACS: 81.20F; 32.30; 78.55

 

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